Scanning Probe Microscopes

Anti Vibration for Scanning Probe Microscopes

The advantages of scanning probe microscopy are numerous. Specimens can be observed in air at standard temperature and pressure rather than in a partial vacuum. Minute local differences in height can be measured without encountering problems with refraction. They can even be used to modify a sample to create small structures, also known as nanolithography.
However, given the fact that scanning probe microscopes are capable of measuring specimens in picometres (one trillionth of a metre), they are extremely vulnerable to the effects of even the slightest vibration from passing traffic or even heavy footfall. As such, it is incredibly important that scanning probe microscopes by isolated from all sources and potential sources of vibration.
The CMS Vibrations Solutions not only offer fast-turnaround products that can effectively treat vibration isolation issues relating to scanning probe microscopes, we can also provide full technical support and, if necessary, implement a comprehensive and bespoke vibration isolation solution specifically designed to meet and overcome all your vibration isolation challenges.
With almost any vibration isolation project, the natural frequency of the isolation material or system is crucial to its performance and a successful outcome. Selecting a product with the wrong natural frequency can not only result in an ineffectual solution but can, in some cases, make matters considerably worse.
Our main solutions for isolating scanning probe microscopes from sources of vibration are the ISR Air Spring System and the SLM Pneumatic Isolator Mount. The ISR offers natural frequencies as low as 1.5Hz and the SLM offers natural frequencies of between 3Hz and 5Hz.

Our Vibration Isolation Systems for Scanning Probe Microscopes

 

ISR Air Spring System

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  • Natural Frequency: As low as 1.5Hz
SLM Pneumatic Isolator Mounts

FH Isolation Hangers

  • Natural Frequency: 3Hz-5Hz